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TECHNART 2011



TECHNART 2011 − Berlin, April 26 - 29, 2011

Non-destructive and microanalytical techniques in art and cultural heritage

Welcome to the website of the international conference TECHNART 2011.

The aim of TECHNART 2011 is to provide a scientific forum to present and promote the use of analytical spectroscopy techniques in the field of cultural heritage. The conference builds on the momentum of TECHNART 2009 offering an outstanding and unique opportunity for exchanging knowledge on leading edge developments. Cultural heritage studies are interpreted in a broad sense, including pigments, stones, metals, glass, ceramics, chemometrics on artwork studies, resins, fibers, forensic applications in art history, archaeology and conservation science.

TECHNART 2011 is organised by BAM Federal Institute for Materials Research and Testing and will take place from 26 to 29 April 2011 in Berlin, Germany, at BAM Headquarters.

 

A picture gallery is now available - click here

 

Conference topics

X-ray microanalysis (XRF, PIXE, XRD, SEM-EDX)
Confocal X-ray microscopy (3D Micro-XRF, 3D Micro-PIXE)
Synchrotron, ion beam and neutron based techniques/instrumentation

FT-IR and raman microscopy
UV-Vis and NIR absorption/reflectance and fluorescence
Laser-based analytical techniques

Magnetic resonance techniques
Chromatography (GC, HPLC) and mass spectrometry

Optical imaging and coherence techniques
Mobile spectrometry and remote sensing

Special Issue in Analytical Bioanalytical Chemistry

We would like to invite you to contribute to a special issue in the context of the TECHNART 2011. The special issue will appear in Analytical and Bioanalytical Chemistry (www.springer.com/abc). Manuscripts need to be critical reviews or full research papers and present original, unpublished work focussing on analytical and bioanalytical themes presented at the conference. Deadline for submissions is May 15, 2011.

More Information here

Sponsors

AnalytiCON Instruments GmbH

Art Innovation

Berlin Tourismus & Kongress GmbH

Bruker AXS

European X-ray Spectrometry Association

HORIBA Scientific

IfG - Institute for Scientific Instruments GmbH

Renishaw GmbH

   

2011-06-17  

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In collaboration with

Helmholtz Zentrum Berlin


TU Berlin


Contact

BAM Federal Institute
for Materials Research
and Testing

Priv.-Doz. Dr. rer. nat.
Oliver Hahn
Unter den Eichen 44-46
12203 Berlin
phone:
+49 30 8104-3821
email:
Oliver.Hahn@bam.de

www.bam.de
www.nike.bam.de

Office

phone:
+49 30 8104-3055
+49 30 8104-3058
fax:
+49 30 8104-3057
email:
technart2011@bam.de